Fairview Microwave Inc., introduces a new family of flexible 50 and 67 GHz VNA test cables. These highly durable assemblies are designed for use as VNA test port extenders and are able to withstand the rigors of the test lab where these cables are constantly flexed and torqued during normal testing situations.
Fairview’s new lines of high frequency VNA test cables display excellent electrical properties such as wonderful phase stability of +/- 6° at 50 GHz and +/- 8° at 67 GHz as well as VSWR of 1.3:1 at 50 GHz and 1.4:1 at 67 GHz. The 50 GHz assemblies are terminated with 2.4mm connectors while the 67 GHz versions utilize 1.85mm connectors. The braided stainless steel armoring surrounding the coax provides a rugged but flexible cable with a flex life exceeding 100,000 cycles, making these test cables ideal for use in semiconductor probe testing, precise bench top testing as well as lab/production testing where the need for a highly flexible, yet durable cable solution is required.
The VNA test cables are also equipped with rugged stainless steel connectors that provide up to 5,000 mating cycles when attached with proper care. Additionally, the flexibility of these cables makes it easier and safer to test a Device Under Test (DUT). A swept right angle 2.4mm and 1.85mm connector option allows these cables to fit in tight spaces and can reduce the length of cable required in many applications.
“Our new flexible and durable 50 and 67 GHz VNA test cables display industry-leading performance which provides engineers and technicians the perfect assemblies for their high frequency testing applications,” explains Brian McCutcheon, VP and General Manager at Fairview.