CAMI Research to host continuity and HiPot testing seminar and training at WPT Expo

CAMI Research Inc. will again host seminar and professional development training sessions at the Wire Processing Technology Expo in Milwaukee, and offer opportunities to win $500 in CableEye accessories.

These sessions will be held on the Tuesday, May 9–the EXPO set-up day. As an exhibitor, they will reveal a new self-driven exhibit for visitors to experience CableEye’s ease of use and flexibility, especially regarding automated testing. CAMI returns to the Expo for the eighth straight year with an expanded booth and more exhibits.

The complimentary seminar “Beyond Continuity & HiPot Measurements” at 10:30 on Tuesday, May 9 at the Wisconsin Center, will be presented by Christopher E. Strangio. Topics include:

• Test Documentation
• Data Security (operator log-in and privilege levels)
• Real-time screening for intermittent connections
• Automation scripting
• Barcode-tracking and archival data-logging
• Benefits of High Voltage (HiPot) Testing
• Q&A

Each seminar attendee will be eligible to participate in a drawing to win $500 in CableEye accessories.  Space is limited, so early booking is advised.

The training session “Improving Reliability of Continuity & HiPot Tests” will be held the afternoon of Tuesday, May 9 in Room 202A at 1:00 p.m. This three-hour course is also presented by Christopher E. Strangio. Topics include:

• Basic Tester Functions
• Cable Resistance Limits
• Automating Tests
• Production Testing for Test Technicians
• Data Security (Operator Login and Privilege Levels)
• Diagnostic Tools
• Barcode-Tracking, Archival Data-Logging
• Custom Connector Design
• High Voltage Test Benefits and Limitations
• 4-Wire Kelvin Measurement
• Protecting your Tester
• Q&A

Each attending trainee will be eligible to participate in a drawing to win $500 in CableEye accessories.

Presenter Christopher E. Strangio is the President and founder of CAMI Research and holds degrees in Electrical Engineering from Villanova University and MIT. A lecturer at the MIT Lowell Institute for twenty years, and author/presenter of a mucroprocessors multimedia course for the MIT Center for Advanced Engineer Study, he has been awarded two patents, developed the CableEye PC-based cable & harness test system, and is a senior member of the IEEE.

Register for the seminar here.

CAMI Research
camiresearch.com